Dynamic decode circuit with active glitch control

ABSTRACT

A dynamic decode circuit for decoding a plurality of input signals comprises a decoder that decodes the plurality of input signals to produce a result at a first node, the result is propagated to a second node while an evaluation clock is active by a pair of serially connected transistors consisting of a transistor receiving an evaluation clock at its gate and a transistor receiving the first node at its gate, the interconnection of the pair of serially connected transistors is precharged when the evaluation clock is inactive to provide a delay between the end of the active evaluation clock and the beginning of the precharge.

FIELD OF THE INVENTION

The present invention is related to computer systems and moreparticularly to controlling glitches in a decode circuit implemented indynamic logic.

BACKGROUND

SRAM (static Random Access Memory) can be limited by the performance ofits address decoders. In certain SRAM designs, as soon as a particularrow of cells may be selected by the corresponding word line going high,the bit lines begin to develop a voltage based on the contents of thememory cells. The sooner the word line goes high, the better the readperformance of the SRAM. Hence, speed up in the operation of the addressdecoders results in a better performance of the memory array.

CMOS logic may be often implemented in dynamic logic where circuits maybe precharged in a precharge phase of clocking, and evaluated in anevaluate stage of the clocking.

Dynamic decode circuits may be synchronous logic circuits that generatean output depending upon a predetermined combination of inputs.Precharge devices may be characterized by two states, precharge andevaluate. In the precharge state, a node may be charged to a known orpredetermined voltage level, for example high (near VDD). In theevaluate state, an array or “tree” of transistors may be given theopportunity to either discharge the node to a second known orpredetermined voltage level, for example low (near VSS) or to allow thecharge to persist. Each input signal may be connected, typically, to agate of one or more of the transistors in the tree. The final charge onthe output node may thereby be controlled by the particular values ofthe inputs and the way in which the transistors may be connected withinthe tree. The final voltage at the node, high or low, acts as the outputof the dynamic decode circuits after being suitably buffered and,perhaps, inverted. The two states of a precharge device each correspondto one of the two logic states of a clock signal cycle to which theprecharge device may be synchronized. Typically, a pfet precharge deviceprecharges the node when the clock is low and evaluates the node whenthe clock is high.

Two common uses for precharge devices may be as decoders and ascomparators. Decoders output a unique signal if and only if all of thebits of an input match a predetermined set of values. A decoder maythereby enable a particular write line in a matrix of memory cells ifand only if an input memory address matches the predetermined address ofa line of memory cells to which the decoder may be connected. Similarly,a comparator will output a unique signal if and only if two inputs, eachcontaining multiple data bits, may be identical.

The particular way the inputs may be combined within the tree of adynamic decode circuit determines the particular operatingcharacteristics (function) and, hence, the particular name of the node.As described above, if the tree discharges the charged node if and onlyif the input bits match a single set of predetermined values, then the adynamic decode circuit may be a decoder. Any Boolean function can beimplemented as a dynamic decode circuit by constructing the tree suchthat the tree causes the precharge device to discharge when the Booleanfunction may be either true or false, as needed by the designer.Logically, it may be irrelevant whether a tree allows the charge in adynamic decode circuit to persist when the Boolean function is true orto persist when the function is false.

Each dynamic decode circuit can be implemented in one of two logicallyequivalent ways. The two implementations correspond to a tree thatdischarges the charged node when the Boolean function is true and to atree that discharges the charged node when the Boolean function isfalse. When a dynamic decode circuit discharges the node if the Booleanfunction is true, it may be said to “evaluate to the active state.” Whenthe precharge device discharges the node if the Boolean function may befalse, it may be said to “evaluate to the inactive state.” One of theseimplementations uses its inputs directly connected in a manner todescribe a particular function. The second implementation uses thecomplements of the inputs and a second function. DeMorgan's law allowsthe designer to restructure the tree of the first function to produce atree for the second function. The second function may be the firstfunction's complement.

Although logically equivalent, each of the two possible implementationsof a dynamic decode circuit has its own disadvantage. Specifically, themore transistors connected in series within the tree, the slower theperformance of the dynamic decode circuit. This disadvantage may betypically associated with a dynamic decode circuit that discharges thecharged node when its function is true. Conversely, a dynamic decodecircuit that evaluates to the inactive state generates an outputunacceptable to many types of circuits. This disadvantage may betypically associated with a dynamic decode circuit that discharges thecharged node when its function is false.

SUMMARY

The shortcomings of the prior art may be overcome and additionaladvantages may be provided through the provision of a dynamic decodecircuit. The dynamic decode circuit comprises a decoder to decode a setof inputs to produce a true or false indication. The dynamic decodecircuit is optionally configured to precharge clock transistors orevaluate clock transistors, such that a combination of N dynamic decodecircuits each implement transistors 1/Nth the size of prior art dynamicdecode circuits. The dynamic decode circuit optionally has a delayedprecharge function to begin precharge of circuits a predetermined timeafter the end of the evaluate period, thus reducing possibility ofunwanted glitches. The dynamic decode circuit optionally precharges theoutput of an evaluate transistor.

In an embodiment, a dynamic decode circuit for decoding a plurality ofinput signals is provided, the dynamic decode circuit comprising: adecoder comprising a plurality of decode transistors, the decodetransistors configured to cause a first node to be in a first statebased on the input signals being in a first input signal state and anevaluation clock signal being active; the decode transistors configuredto cause the first node to be in a second state based on the inputsignals being in a second input signal state other than the first inputsignal state and the evaluation clock signal being active; an evaluateclock circuit conductively connected between a first power source and asecond node, the evaluate clock circuit consisting of a first transistorand a second transistor, the first transistor serially connected by afirst interconnecting node to the second transistor, the firsttransistor comprising a first gate configured to receive the evaluationclock signal, the first transistor configured to conduct based on theevaluation clock signal being active, the second transistor comprising asecond gate conductively connected to the first node, the firsttransistor configured to not conduct based on the evaluation clocksignal being inactive; and one or more precharge circuits conductivelyconnected to a second power source, the precharge circuits configured toprecharge the first node and the second node and the firstinterconnecting node based on the evaluation clock signal beinginactive, the precharge circuits configured to not conduct based on theevaluation clock signal being active.

In an embodiment, at least one of the precharge circuits is a delayprecharge circuit, the delay precharge circuit configured to delay startof precharge by a predetermined delay following the evaluation clockbecoming inactive.

In an embodiment, the precharge circuit configured to precharge thefirst interconnecting node is a delay precharge circuit.

In an embodiment, the delay precharge circuit consists of a thirdtransistor serially connected by a second connection to a fourthtransistor, the third transistor having a third gate configured toreceive the evaluation clock signal, the fourth transistor having afourth gate configured to receive a delay clock signal the delay clocksignal being a delayed version of the evaluation clock signal.

In an embodiment, the dynamic decode circuit further comprises aserially connected plurality of fifth transistors, the plurality offifth transistors disposed between the second power source and the firstnode, the plurality of fifth transistors each configured to receive arespective one of the plurality of input signals, the plurality of fifthtransistors configured to keep the first node in the recharge statebased on the input signals being in the first state.

In an embodiment, the dynamic decode circuit further comprises: a sixthtransistor coupled between the second node and the second power source,the sixth transistor comprising a sixth gate coupled to the first node,the sixth transistor configured to keep the second node in the prechargestate based on the first node being in the state other than theprecharge state.

In an embodiment, the plurality of decode transistors are conductivelyconnected in parallel with one another.

In an embodiment, the decoder further comprises a third node, the thirdnode interconnecting the plurality of decode transistors to a clockingtransistor, the clocking transistor conductively connected to the firstpower source, the clocking transistor having a clocking gate configuredto receive the evaluation clock signal.

In an embodiment, the clocking transistor is the first transistor, andthe third node is conductively connected to the first interconnectingnode.

In an embodiment, the precharge circuits configured to precharge thefirst node and the second node and first interconnecting node are delayprecharge circuits, each delay precharge circuit consisting of a thirdtransistor serially connected by a second connection to a fourthtransistor, the third transistor having a third gate configured toreceive the evaluation clock signal, the fourth transistor having afourth gate configured to receive a delay clock signal, the delay clocksignal being a delayed version of the evaluation clock signal.

In an embodiment, the one or more precharge circuits comprise a firstprecharge circuit and a second precharge circuit, the first prechargecircuit configured to precharge the first node consisting of a sixthtransistor and the second precharge circuit configured to precharge thesecond node consisting of a seventh transistor, the sixth transistorhaving a sixth gate configured to receive the evaluation clock signal,and the seventh transistor having a seventh gate configured to receivethe evaluation clock signal.

In an embodiment, the fourth transistor of the dynamic decode circuit isconductively connected by the second interconnection to fourthtransistors of a plurality of other dynamic decode circuits, whereby allfourth transistors of all dynamic decode circuits are conductivelyconnected in parallel between the second power source and the secondinterconnection.

In an embodiment, the first transistor of the dynamic decode circuit isconductively connected by the first interconnection to first transistorsof a plurality of other dynamic decode circuits, whereby all firsttransistors of all dynamic decode circuits are conductively connected inparallel between the first power source and the first interconnection.

In an embodiment, a dynamic decode circuit is provided comprising: anevaluation clock circuit comprising a pair of nfet transistorsconsisting of a first nfet transistor serially connected at a firstinterconnection node to a second nfet transistor, the first nfettransistor having a gate configured to receive an evaluation clocksignal, the second nfet transistor having a gate conductively connectedto a first node, the pair of nfet transistors conductively connectedbetween a first power source and a second node; a decode circuitcomprising a plurality of third nfet transistors conductively connectedin parallel between the first node and a third node, each third nfettransistor having a gate configured to receive a respective input signalof a plurality of input signals, the third node conductively connectedto the first power source through a fourth nfet transistor, the fourthnfet transistor having a gate configured to receive the evaluation clocksignal, the third nfet transistors configured to cause the first node totransition to a result value based on state of the plurality of inputsignals and based on the evaluation clock signal being high; a prechargecircuit consisting of a pair of pfet transistors consisting of a fifthpfet transistor serially connected at a second interconnection node to asixth pfet transistor, the fifth pfet transistor having a gateconfigured to receive a delayed evaluation clock signal, the sixth pfettransistor having a gate configured to receive the evaluation clocksignal, the pair of pfet transistors disposed between a second powersource and the first interconnection node, the pair of pfet transistorsconfigured to cause the first interconnection node to be precharged highbased on both the delayed evaluation signal being low and the evaluationclock signal being low; and a keeper circuit comprising a seventh pfettransistor conductively connected between the second power source andthe second node, the seventh pfet transistor having a gate conductivelyconnected to the first node, the seventh pfet transistor configured tokeep the second node high based on the first node being low.

In an embodiment, a plurality of dynamic decode circuits is provided,each dynamic decode circuit comprising a decoder configured to decode acorresponding plurality of input signals, each dynamic decode circuitfurther comprising a conditioning transistor configured to condition aconditioned node of the dynamic decode circuit, the conditioningtransistor having a gate conductively connected to a clock signal, theconditioning transistor conductively connected between the conditionednode and a power source, each conditioning transistor of each dynamicdecode circuit conductively connected in parallel between the powersource and interconnected conditioned nodes of the plurality of dynamicdecode circuits.

In an embodiment, the conditioning transistor comprises a firstprecharge pfet transistor configured to precharge the conditioned nodeof the dynamic decode circuit, the plurality of dynamic decode circuitssharing drains of respective first precharge pfet transistors.

In an embodiment, the conditioning transistor consists of an nfetevaluate transistor configured to evaluate function of the dynamicdecode circuit, the plurality of dynamic decode circuits sharing drainsof respective evaluate transistors.

In an embodiment, the conditioning transistor comprises two seriallyconnected transistors consisting of the first precharge pfet transistorhaving a first gate configured to receive an evaluation clock signal anda second precharge pfet transistor having a second gate configured toreceive a delayed evaluation clock signal.

In an embodiment, the plurality of dynamic decode circuits areconfigured, based on the state of the input signals, to enable a decoderof only a predetermined maximum number of dynamic decode circuits of theplurality of dynamic decode circuits to conduct in any clock cycle,wherein size of the conditioning transistor is determined by a ratio ofthe predetermined maximum number to a total number of dynamic decodecircuits.

In an embodiment, the predetermined maximum number is one.

Additional features and advantages may be realized through thetechniques of the present invention. Other embodiments and aspects ofthe invention may be described in detail herein and may be considered apart of the claimed invention. For a better understanding of theinvention with advantages and features, refer to the description and tothe drawings.

BRIEF DESCRIPTION OF THE DRAWINGS

The subject matter which may be regarded as the invention may beparticularly pointed out and distinctly claimed in the claims at theconclusion of the specification. The foregoing and other objects,features, and advantages of the invention may be apparent from thefollowing detailed description taken in conjunction with theaccompanying drawings in which:

FIG. 1 depicts an example embodiment of a dynamic decode circuit;

FIG. 2 depicts an example dynamic decode circuit with a DCLK clock;

FIG. 3 depicts an example dynamic decode circuit with a DCLK clock andisolated Node 3;

FIG. 4-FIG. 6 depict example decode functions;

FIG. 7 depicts use of PSHARE and NSHARE;

FIG. 8 depicts a timing chart according to an example implementation;

FIG. 9 depicts an example circuit for creating a DCLK;

FIG. 10 depicts an example timing relationship of Evaluate andPrecharge; and

FIG. 11 depicts an example dynamic decode circuit with CLK clock.

The detailed description explains the preferred embodiments of theinvention, together with advantages and features, by way of example withreference to the drawings.

DETAILED DESCRIPTION OF EMBODIMENTS Glossary of Terms

In dynamic logic, a problem arises when cascading one gate to the next.The precharge “1” state of the first gate may cause the second gate todischarge prematurely, before the first gate has reached its correctstate. This uses up the “precharge” of the second gate, which cannot berestored until the next clock cycle, so there may be no recovery fromthis error.

In order to cascade dynamic logic gates, one solution may be DominoLogic, which inserts an ordinary static inverter between stages. Whilethis might seem to defeat the point of dynamic logic, since the inverterhas a pfet (one of the main goals of Dynamic Logic may be to avoid pfetswhere possible, due to speed), there may be two reasons it works well.First, there may be no fan-out to multiple pfets; the dynamic gateconnects to exactly one inverter, so the gate may be still very fast.Furthermore, since the inverter connects to only nfets in dynamic logicgates, it too may be very fast. Second, the pfet in an inverter can bemade smaller than in some types of logic gates.

In Domino logic cascade structure of several stages, the evaluation ofeach stage ripples the next stage evaluation, similar to a dominofalling one after the other. Once fallen, the node states cannot returnto “1” (until the next clock cycle) just as dominos, once fallen, cannotstand up, justifying the name Domino CMOS Logic. It contrasts with othersolutions to the cascade problem in which cascading may be interruptedby clocks or other means.

Bulk-CMOS refers to Complementary Metal Oxide Semiconductor and refersto a design and fabrication technology for semiconductors.

SOI (Silicon On Insulator) where Insulator may be Oxide or nitride ofSilicon and the like or Sapphire. The SOI field effect transistor n-type(nfet) has a parallel parasitic bipolar NPN transistor associated withit. The drain of the n-type may be equivalent to the collector of theparasitic bipolar transistor. The source of the n-type may be equivalentto the emitter of the parasitic bipolar transistor. The body of then-type becomes charged by induced leakage whenever the drain and sourceterminals may be held at a high potential. If the source may be droppedto a low potential the trapped charge in the body causes a current toflow from the base of the parasitic bipolar transistor. This causes acurrent to flow in the collector that may be parallel to a currentflowing in the drain. This action may discharge the drain node of adynamic circuit and may result in erroneous evaluation. The SOI devicemay be strained by introducing another material with different atomicsize than Silicon e.g. Germanium and the like.

A Metal Oxide Semiconductor (MOS) transistor has two electrodes referredto as the source and the drain and a control electrode as the gate. Atransistor has a bulk connection which may be floating e.g. in SOI.

N-type (nfet) may be a Metal Oxide Semiconductor (MOS) transistor withelectrons as majority carriers.

P-type (pfet) may be a Metal Oxide Semiconductor (MOS) transistor withholes as majority carriers

Primitives may be technology independent logic gates e.g. AND gates, ORgates, NOT etc.

NAND logic gate may be inversion of AND and NOR logic gate may beinversion of OR.

.lib is the Synopsys library format.

Digital design Synthesis may be used to mean the synthesis is of atechnology dependent model from a register transfer level description orfrom interconnected functional blocks to result in standard-cell mappeddesign from a target library, or result in a combination ofstandard-cell mapped design from a target library and a transistor levelrepresentation for part or all of the input design specification.

Under DeMorgan's theorem, a NAND gate with inverted inputs performs anOR function and a NOR gate with inverted inputs performs an ANDfunction.

A short-circuit occurs when there is a path of zero or almost zeroresistance between a first known voltage level and a second knownvoltage level.

A non-inverting node has no inversion e.g. AND, OR and the like or acombination of these.

An inverting node has inversion e.g. NAND, NOR, NOT and the like or acombination of these.

As used herein, VDD voltage level may be referred to as “high” or“positive”, and a VSS voltage level may be referred to as “low” or“negative”. A logical “1” may be referred to as “high” or “positive” anda logical “0” may be referred to as “low” or “negative”. Pfettransistors conduct when the pfet transistor gate is low and nfettransistors conduct when the nfet transistor gate is high. Low powerpfet transistors may be used as “keeper” circuits to hold a node high.These pfet transistors may be too weak to keep a node high if a strongernfet transistor conducts in series with the pfet, so the nfet willovercome the pfet and pull the node low. However, the keeper circuitsmay keep the node high if there is only a brief glitch on the node.

Dynamic decode circuits 150 250 350 are characterized as circuits thatdecode input signals B0 B1 B2 to produce an active output value OUTbased on the input signals having a predetermined value. Certaininternal nodes Node 1 Node 2 and the output OUT are set to an initialvalue during the precharge phase of the dynamic decode circuit clockCLK, In the example, the dynamic decode circuit is a domino circuitcharacterized by the inverter 108 resulting in the output OUT being lowduring the precharge phase (CLK low). Only when the input signals havethe predetermined value (all low) during the evaluate phase (CLK high)in the example, will the output value OUT transition to the active value(high).

Embodiments are provided that improve size, performance and stability ofdynamic decode circuits over prior art embodiments. In one embodiment,Node 3 is precharged to introduce a delay to avoid glitches due to priorart quick transition of Node 3 relative to Node 1 as now Node 3 goesactive (low) from VDD rather than a floating gate of prior art. Thedelay introduced non-intuitively, may improve performance of the dynamicdecode circuit.

In one embodiment, a delay is introduced between the evaluate phase andthe precharge phase which reduces glitches and enables the dynamicdecode circuit to keep the output OUT signal active longer.

In this specification, elements included in Figures having the samenumeric tag may have substantially the same function.

In an embodiment, nodes of a common dynamic decode circuit (NSHARE,PSHARE) are designed with much smaller clocked transistors, takingadvantage of the fact that the dynamic decode circuit is provided inmultiple modules of a design, and that only one decode function of allthe modules will be selected in any evaluate cycle. Thus thesetransistors share the current requirement in parallel with each otheramongst the multiple modules. This non-intuitive reduction in transistorsize may improve performance of the overall implementation.

Referring to FIG. 1, an embodiment of a dynamic decode circuit 150 isshown.

In the embodiment, CLK signal 114 when high may be in an evaluatingphase and when low may be in a precharging phase. In an embodiment, theCLK signal may be asymmetrical, i.e. high (active) only for 30% of theCLK signal period for example.

In the precharge phase the evaluation clock signal CLK may be low. Thelow CLK turns off nfet 110 and turns on pfets 104 105. In turn, pfet 104precharges internal Node 1 high and pfet 105 precharges Node 2 highwhich forces output OUT low. During the precharge phase the inputs B0 B1and B2 may change state but Node 1 will stay high. Due to the nature ofdynamic logic, if any of the inputs B0 B1 B2 go positive momentarily inthe evaluate stage, Node 1 may be pulled low and stay low independent ofother input changes until the next precharge phase.

The evaluate phase occurs when the CLK signal goes high. This turns offthe precharge transistors 104 105 and turns on the evaluate clocktransistor 110. If any of the three inputs B0 B1 or B2 are high a pathfrom internal Node 1 to VSS through 110 may be created and Node 1 may bepulled low. During the evaluation phase, with Node 1 low, nfet 109 turnsoff causing Node 2 to stay high and the output OUT stays low. If,however, all three inputs are low during the evaluation phase, Node 1remains in the high state through the influence of keeper 106. Pfets maybe sized to be much weaker than the nfets in the circuit so as to beeasily overridden when a node is pulled low.

If any of the inputs B0 B1 B2 go positive momentarily in the evaluatestage, Node 1 will stay low independent of the inputs until the nextprecharge phase.

Three pfet series transistors 101 102 103 perform a keeper function onNode 1. They receive respective input signals B0 B1 and B2 and keep Node1 positive after a glitch on Node 1 if all the inputs are low,independent of CLK.

The name domino comes from the analogy between a sequence of dominologic gates connected in series and a line of domino pieces stood onedge in a row. When the evaluate phase starts a high going output fromthe first stage can quickly propagate down the chain of dynamic logicdischarging internal evaluation nodes like one domino piece knockingdown the next piece in the row and so on.

Notice that during the evaluate phase, if Node 1 is pulled low that itwill remain low until the next precharge phase. Therefore it may beimportant for all inputs to a dynamic gate to remain stable in theirintended state while the evaluate signal CLK is high. That is incontrast to a static logic gate that imposes no restriction on wheninputs may change state. Also notice that the output of a dynamiccircuit will always go low during the precharge phase regardless of thestate of the inputs.

That means a dynamic gate may undergo switching activity each clockcycle even if the inputs remain unchanged.

For all its complexity and constraints, the dynamic decode circuit inFIG. 1 has a number of advantages over its static cousins. First of all,the complementary network of pfets in a static CMOS logic gate has beenreplaced by a precharge pfet 104 105 and keeper pfet 106 107. The logicfunction of the gate may be entirely determined by the topology of thenfet pull down network 111 112 113 in the first stage of the dominocircuit. This has a profound impact on performance since thecomplementary pfet network typically represents over half the circuitand roughly ⅔ of the non-interconnect related internal parasiticcapacitance. In general, the higher the fan-in (number of inputs) of alogic function the greater the potential performance advantage of adynamic circuit implementation.

Another advantage of dynamic logic may be that fast logic propagationoccurs in only one direction—internal evaluation node falls while thestage output rises. The opposite transition occurs during the prechargephase in parallel across all logic stages and isn't as time critical.This means the transistor size ratios in dynamic circuits can be skewedto increase propagation speed for the active transition. For example, ina domino circuit the W_(P):W_(N) ratio in the output inverter may be ashigh as 6:1 in practice. In addition, the input voltage level that adynamic logic stage switches may be typically lower than for a staticlogic gate. This may be an advantage in reducing signal propagationtimes but may be also a disadvantage in that circuits may be much morevulnerable to induced noise on logic signals. Typical design practicemay be for signals that travel a long distance (and thus may be moresusceptible to noise and ground shift) to be cleaned up by passingthrough a latch 107 108 (for example) or static logic gate 108 beforeconnecting to the input of another dynamic circuit.

A dynamic decode circuit FIG. 1 may perform the steps of precharging afirst and a second node to a first known voltage at a first time andevaluating the voltage on the first node at a second time. The firstnode and a third node may be coupled to a transistor tree 111 112 113.The tree may be operable to electrically short-circuit the two nodes(Node 1 Node 3) responsive to input signals B0 B1 B2. The second nodeNode 2 may be coupled to a first current electrode of a screeningtransistor 109. The screening transistor also has a second currentelectrode and a control electrode. The control electrode of thescreening transistor may be coupled to the first node and the secondcurrent electrode of the screening transistor may be coupled to thethird node.

In the embodiment, CLK signal 114 when high may be in an evaluatingphase and when low may be in a precharging phase. In an embodiment, theCLK signal may be asymmetrical, i.e. high (active) only for 30% of theCLK signal period for example.

The embodiment may include a special precharge circuit 115 forprecharging an internal node between serially connected transistors 109110 of an evaluation circuit 120. The evaluation circuit causing Node 2to transition to the inverse of Node 1 when the evaluation clock CLKgoes high. The special precharge circuit 115 is not intuitive since itwould appear to introduce an unwanted delay in the dynamic decodecircuit 150. However, advantages may outweigh the negatives, forexample, in an implementation where a plurality of dynamic decodecircuits are provided, the overall performance may improve.

In an embodiment, the evaluation clock CLK provided to the specialprecharge circuit 115 is the same evaluation CLK provided to theevaluation clock used by evaluation transistors nfet 110.

In an embodiment, the clock CLK provided to the special prechargecircuit 115 may be a special evaluation clock SCLK different from theevaluation clock CLK used by evaluation transistors nfet 110 of thedynamic decode circuit. The SCLK may be a delayed version DCLK of theevaluation clock CLK. In an embodiment, the SCLK is high longer than theCLK is high, causing a delay in beginning precharge after the fall ofCLK. In an embodiment, a precharge circuit 104 105 other than thespecial precharge circuit 115, may be provided with the specialevaluation clock SCLK. In an embodiment, the circuit 150 employs aserial pair of clocking pfet transistors 218 217 to perform theprecharge functions of the special precharge circuit 115. Preferably theprecharge phase starts at a predetermined time after the end of theevaluation phase (CLK high). During the predetermined period, the resultof the evaluation is maintained. The serial pair includes a respectiveCLK pfet transistor 218, and a respective DCLK pfet transistor 217. TheDCLK may be a delayed version of the evaluation clock CLK. A DCLK signalapplied to the DCLK pfet transistor causes the start of the prechargecycle to be delayed.

In the precharge phase the evaluation clock signal CLK may be low. Thelow CLK turns off nfet 110 and turns on pfets 104 105. In turn, pfet 104precharges internal Node 1 high and pfet 105 precharges Node 2 highwhich forces output OUT low. During the precharge phase the inputs B0 B1and B2 may change state but Node 1 will stay high. Due to the nature ofdynamic logic, if any of the inputs B0 B1 B2 go positive momentarily inthe evaluate stage, Node 1 may be pulled low and stay low independent ofother input changes until the next precharge phase.

The evaluate phase occurs when the CLK signal goes high. This turns offthe precharge transistors 104 105 and turns on the evaluate clocktransistor 110. If any of the three inputs B0 B1 or B2 are high a pathfrom internal Node 1 to VSS through 110 may be created and Node 1 may bepulled low. During the evaluation phase, with Node 1 low, nfet 109 turnsoff causing Node 2 to stay high and the output OUT stays low. If,however, all three inputs are low during the evaluation phase, Node 1remains in the high state through the influence of keeper 106. Pfets maybe sized to be much weaker than the nfets in the circuit so as to beeasily overridden when a node is pulled low.

Referring to FIG. 2, the circuit 250 employs serial pairs of clockingpfet transistors 104 211, 105 212 and 218 217 to perform the prechargefunctions. Preferably the precharge phase starts at a predetermined timeafter the end of the evaluation phase (CLK high). During thepredetermined period, the result of the evaluation is maintained. Eachserial pair includes a respective CLK pfet transistor 104 105 218, and arespective DCLK pfet transistor 211 212 and 217. A DCLK signal appliedto the DCLK pfet transistor causes the start of the precharge cycle tobe delayed.

In an embodiment the DCLK signal may be a delayed version of theevaluation clock signal CLK as shown in FIG. 10. CLK may be passedthrough two inverters 901 and 902 to produce the delayed DCLK signal.Other means may be used, for example, CLK may be passed over a delayline (long wire) to produce a DCLK.

FIG. 10 shows the relationship of the example precharge function whereinprecharge is delayed for a predetermined period T1-T2. The CLK signalgoes high at T0 and goes low at T1. DCLK is depicted as a delayedversion of CLK that goes low at T2. The precharge circuits (105 212 forexample) causes the respective precharged node (Node 2) to go high at T2when both CLK and DCLK are low and then low again at T3 when CLK goeshigh. Of course, in other embodiments, different circuitry may be usedto create the precharge function. In an embodiment, CLK is used to clockthe nfets and a PCLK is used to clock the precharge pfets. PCLK iscreated to have the relationship to CLK of the PRECHARGE signal depictedin FIG. 10.

Returning to FIG. 2, in different embodiments, the effective prechargemay start before or after CLK, and may have an active period greater orless than CLK. Pfet keeper transistor 215 attempts to hold Node 2 highas long as Node 1 is low. The decoder section 200 may be unchanged fromthe prior art. The evaluation clocking section 201 is different from theprior art as Node 3 is now precharged via a serial pair of pfettransistors 217 and 218 receiving DCLK and CLK respectively. FurthermoreNode 3 may be made available to other circuits as an NSHARE signal toprovide the precharged evaluation Node 3 to other circuits.

Referring now to FIG. 3, another example embodiment is shown. In thiscase, a PSHARE node may be created to provide the DCLK function to othercircuits. In this implementation, each node to be precharged Node 1,Node 2 and Node 3, has an evaluation clock pfet transistor 104, 105 and312, but not a pair. Instead each valuation clock pfet transistor source104 105 and 312 is connected to the drain of a single DCLK pfettransistor 310. Furthermore, in this example, Node 3 is not prechargedbut may be separately clocked by evaluation nfet transistor 311 andNSHARE may be separately clocked by evaluation nfet transistor 312 inseries with nfet transistor 313. In this embodiment, NSHARE isprecharged according to the delay described in FIG. 10, but Node 3 isnot precharged directly. In an implementation, another node may beprecharged, for example Node 3. In another embodiment, another node mayperform a SHARE function, for example, Node 3 may be shared by multiplemodules 350 to reduce the size of nfet 311.

Referring again to FIG. 2, when the evaluation clock signal (CLK) is inthe precharge state (low), the circuit 250 may be in the precharge orrestore state. In this state, Node 1, Node 2, Node 3 may be allprecharged to high. The DCLK signal may be logically the same as CLK butdelayed in time to allow for a wider output pulse to delay the start ofprecharge. When the CLK signals transitions high or evaluate state, theinput signals B0 B1 and B2 will be evaluated. Therefore, if one or moreof the input signals B0 B1 B2 goes high, Node 1 will transition to low,thus turning off nfet 214 and Node 2 will maintain its originalprecharge high voltage state. The transition of Node 1 to low turns onthe keeper pfet transistor 215. Thus transistor 215 will maintain theoriginal high voltage state on Node 2. At the end of the operation orcycle, CLK and DCLK will transition back to low and all prechargetransistors: 104 105 218, will be in their conduction state with Node 1,Node 2, Node 3 and NSHARE held in the high voltage state. Thus theoutput signal OUT will maintain a low (not selected) state.

By precharging the NSHARE Node 3 every cycle, the source terminal ofnfet 214 transitions to the low state with NSHARE during the evaluationphase when transistor 213 conducts. While at the same time Node 1 willtransition to the low during the evaluation phase when any decodetransistor 111 112 113 conducts. Therefore the nfet 214 gate-to-sourcevoltage may be kept below the turn on voltage necessary for that deviceto conduct. This minimizes glitching of Node 2, and allows the arrivalof input signals B0 B1 B2 to be coincident to the CLK input without anyimpact to functionality. Therefore, by precharging the node NSHARE, abuilt-in delay is provided allowing the input decode stage 200 toevaluate (pull-down) before the nfet evaluation stack 201 consisting ofnfet transistor 213 and nfet transistor 214 (connected to Node 2) canconduct thus allowing for a small setup time between the input signalsB0 B1 B2 and the evaluation clock signal CLK.

When the evaluation clock signal (CLK) is in the precharge phase (low),the circuit 250 may be in the precharge or restore state according tothe precharge start delay previously described. In this state, Node 1,Node 2, Node 3 and NSHARE may be all precharged to the high voltagestate. Again, the DCLK signal may be logically the same as evaluationclock signal CLK but delayed in time to allow for a wider output pulseto delay the start of precharge. When the CLK signals transitions tohigh (or evaluation), the input signals BO B1 B2 will be evaluated.Therefore, if all input signals B0 B1 B2 are low, Node 1 will maintainits original precharge high voltage state, thus allowing nfet 214 toconduct and Node 2 will transition to low when NSHARE transitions tolow. Thus pfet keeper transistor 215 will be in the non-conductionstate, so as to allow Node 2 to transition to low and the output signalOUT to transition to high (the selected state). At the end of theoperation or cycle, CLK and DCLK will transition back to low and allprecharge transistors will be in the conduction state so as to prechargeNode 1, Node 2, Node 3 and NSHARE back high. Finally, the output signalsOUT will transition back to low when the delay clock DCLK transitionsback to low. This delay DCLK action allows for an output OUT pulse widthis wider than the CLK pulse width. A keeper function may be providedwith pfets 101 102 103 such that with all inputs B0 B1 B2 low, Node 1may be kept high by the conduction of the 3 serial pfets 101 102 103.

The NSHARE node allows for multiple dynamic decode circuits to share thebottom nfet 213, 312 for larger effective pull-down strength and anoverall faster evaluate action of Node 2's transition to the low voltagestate. Each dynamic decode circuit has a bottom nfet and conducts inparallel with all other bottom nfets, so the bottom nfets can besignificantly smaller in an embodiment where only one of the multipledynamic decode circuits will be selected by its decode function.

Referring to FIG. 3, a further enhancement may be the addition of thePSHARE node to further reduce the load on the DCLK signal whiledelivering a larger effective pull-up strength. Also shown is theaddition of a separate pull-down nfet 311 for the input NOR circuit.With this approach, NSHARE may be separated from the new Node 3 allowingadditional circuit optimization for glitch reduction on Node 2.

NSHARE and PSHARE may be of particular use in logic modules thatfunction mutually exclusively as in an application of decode circuit 350for example. In that application, the same logic module design may beused repetitively to select, for example, a respective word-line of arandomly accessed memory (RAM). Since only one module 350 can beselected by a particular address (inputs B0 B1 B2), only one module 350OUT will be activated for any particular address. Thus, the evaluate CLKnfet 312 for each module 350 will operate in parallel, so the nfet 312can be much smaller. In an example, eight decode modules 350 usingNSHARE need only implement nfets 312 ⅛th the size of a module 350 notusing NSHARE to achieve the same current capability.

PSHARE similarly shares the precharge pfet 310 amongst multiple modules,thus the pfet 310 can be ⅛th the size of a pfet not using PSHARE.

Not only does PSHARE reduce the physical size of a die used for modules350, it may also cause the module to be faster than a traditionaldynamic logic implementation.

Other embodiments may include other decode circuits other than 200. FIG.4 depicts a decoder consisting of parallel nfets. FIG. 5 depicts adecoder 500 consisting of another arrangement of nfet transistors. FIG.6 depicts a decoder consisting of both parallel and serial nfettransistors.

FIG. 7 depicts an example PSHARE NSHARE embodiment, depicting n modules350 Decode 1 through Decode n of dynamic decode circuit FIG. 3 forexample. Since the decode circuit 200 of each module 350 is decoding aunique function, the decode circuit 200 of only one of the Decodemodules can conduct for any particular cycle. One module 350 Decode 1receives inputs B0 B1 B2 for determining OUT A1, the other module 350also receives inputs to determine mutually exclusive OUT signals. Thenth module is shown Delay n having inputs B0 n B1 n B2 n and producingOUT signal OUT An. All NSHARE A1 through NSHARE An nodes are commonlywired as are all PSHARE A1 through PSHARE An nodes. Therefore currentfor evaluation is provided by each transistor 312 in parallel althoughonly one Delay module decode is active, therefore each nfet transistor312 need only handle 1/nth the current and can be much smaller than inprior art. Similarly, each DCLK transistor 310 operating in parallel,only needs to provide current for 1/nth the requirement and only needsto be 1/nth the size of the prior art.

The DCLK pfet 310 may be 1/nth the size of a non PSHARE implementationbecause the pfets 310 of each module operate in parallel but only onemodule is selected. Similarly the nfets 312 may be 1/nth the size of nonNSHARE implementations because the nfets 312 of each module operate inparallel but only one module is selected.

FIG. 8 shows an example voltage waveform 800 of the decode circuits 350having decoder 200 performing a NOR function. The first cycle may beindicated by the falling edge of system clock. In the first cycle, allinputs stay low except for B0 which transitions high. The evaluationclock “CLK” may be a delayed version of system clock in an embodiment.The first cycle shows 801 the evaluation clock signal “CLK” rising atthe same time the input B0 may be rising. This signal relationship showswhat may be called a zero setup-time; therefore, with B0 high, thedecoder 200 may be in a non-selected state (the NOR function requiresall inputs be low), so notice the falling edge of Node 1 turning off thenfet 214 313. Also, there may be a relatively small downward glitch 802on Node 2 where most of the glitch may be due to the normal capacitivecoupling action from the downward movement of Node 1. Also, there may bea downward voltage transition of NSHARE. As mentioned above, the delay803 of NSHARE vs the falling transition of Node 1 due to the prechargingof NSHARE, prevents the nfet 214 from turning on, thus minimizing theglitch seen on Node 2.

The second cycle shown shows the case where all inputs may be at the lowstate (selected state) except for input B0. In this cycle input B0transitions 805 from high to low at the same time the input clock CLKtransitions to high (to the evaluate clock state). In the fully selectedstate (all inputs low), Node 2 transitions to low and the output (OUT)transitions to high. Notice here that Node 2 glitches slightly downward806, but recovers and may be held high by the active pull-up action ofthe pfet keeper stack 101 102 103. Also notice the falling edge of DCLK807 which triggers the delayed beginning of the precharge of Node 1,Node 2, NSHARE and PSHARE.

A timing diagram of FIG. 2, where NSHARE may be common with Node 3 wouldhave a different wave form. For an example, Node 3 may be prechargedalong with NSHARE, so the wave form for Node 3 would go high when DCLKgoes low on the second phase.

Various combinations of nfet transistors may be employed to performdecode functions within the scope of embodiments. Other decode functionsmay include combinations of pfet and nfet transistors. Furthermore theseembodiments may advantageously provide internal nodes subject toprecharge over and above Node 1 and Node 3. Referring to FIGS. 4, 5 and6, various example alternatives of input decoders 200 may be depicted.FIG. 4 depicts the NOR gate function as shown in FIG. 1, FIG. 2 and FIG.3. The function of Node 1 may be not-B0 (B0 ) AND not-B1 (B1 ) ANDnot-B2 (B2 ). Other decoders may be well known in the art and may employnfets in various arrangements.

FIG. 5 shows one example decoder circuit 500 which includes nfettransistors 111 112 of FIG. 2, wherein nfet transistor 501 may be aninverter configured to feed the gate of nfet transistor 113 and includesan internal Node 4 connected to the drain of FIG. 501. The function ofNode 1 of FIG. 5 may be not-B0 (B0 ) AND not-B1 (B1 ) AND X1. In thisdecoder, new nodes may be introduced (Node 4) requiring a prechargefunction pfet 502.

FIG. 6 depicts example decode circuit 600 that includes nfet transistors111 and 112 of FIG. 2 and serial transistors 600 601 having an internalNode 5. Input B2 and X2 must both be high in order to pull Node 1 low.The function of decoder 600 may be not-B0 (B0 ) AND not-B1 (B1 ) AND[not-B2 (B2 ) OR not-X2 (X2 )].

Referring to FIGS. 1, 2 and 3, in an embodiment, a dynamic decodecircuit 250 350 is provided for decoding a plurality of input signals B0B1 B2, the dynamic decode circuit 250 350 comprising: a decoder 200comprising a plurality of decode transistors FIGS. 4, 5, 6, the decodetransistors are configured to cause a first node Node 1 to be in a firststate based on the input signals B0 B1 B2 being in a first input signalstate and an evaluation clock signal being active; the decodetransistors are configured to cause the first node Node 1 to be in asecond state based on the input signals BO B1 B2 being in a second inputsignal state other than the first input signal state and the evaluationclock signal CLK being active; an evaluate clock circuit 201 301 isconductively connected between a first power source VSS and a secondnode Node 2, the evaluate clock circuit comprising a first transistor110 213 312 and a second transistor 109 214 313, the first transistor110 213 312 is serially connected by a first interconnecting node NSHAREto the second transistor 109 214 313, the first transistor 110 213 312comprising a first gate configured to receive the evaluation clocksignal, the first transistor 110 213 312 is configured to conduct basedon the evaluation clock signal being active, the second transistor 109214 313 comprising a second gate conductively connected to the firstnode Node 1, the first transistor is configured to not conduct based onthe evaluation clock signal being inactive; and one or more prechargecircuits conductively connected to a second power source, the one ormore precharge circuits are configured to precharge the first node Node1 and the second node Node 2 and the first interconnecting node NSHAREbased on the evaluation clock signal CLK being inactive, the prechargecircuits configured to not conduct based on the evaluation clock signalCLK being active.

Precharge circuits may comprise transistors 104, 105, 218, 314. One ormore of the precharge circuits may be a delay precharge circuit 220,each delay precharge circuit further comprising a serially connectedtransistor for receiving a delayed evaluation clock (DCLK) for examplein FIG. 2. Transistor pairs may be discrete pairs as shown in FIG. 2 104211, 105 212, 218 217, or may employ a shared transistor 310 as shown inFIG. 3 to provide the pairs 104 310, 105 310 314 310.

In an embodiment, at least one of the precharge circuits is a delayprecharge circuit, the delay precharge circuit configured to delay startof precharge by a predetermined delay following the evaluation clockbecoming inactive.

In an embodiment, the precharge circuit configured to precharge thefirst interconnecting node is a delay precharge circuit.

In an embodiment, the delay precharge circuit comprises a thirdtransistor 104 105 218 104 105 or 314 serially connected by a secondconnection to a fourth transistor 211 212 217, 310, the third transistorhaving a third gate configured to receive the evaluation clock signalCLK, the fourth transistor having a fourth gate configured to receive adelay clock signal. DCLK the delay clock signal is a delayed version ofthe evaluation clock signal CLK.

In an embodiment, the dynamic decode circuit further comprises aserially connected plurality of fifth transistors 101 102 103, theplurality of fifth transistors disposed between the second power sourceVDD and the first node Node 1, the plurality of fifth transistors eachconfigured to receive a respective one of the plurality of input signalsB0 B1 B2, the plurality of fifth transistors 101 102 103 configured tokeep the first node in the precharge state based on the input signals B0B1 B2 being in the first state.

In an embodiment, the dynamic decode circuit further comprises: a sixthtransistor 215 coupled between the second node Node 2 and the secondpower source VDD, the sixth transistor 215 comprising a sixth gatecoupled to the first node Node 1, the sixth transistor configured tokeep the second node in the precharge state based on the first nodebeing in the state other than the precharge state.

In an embodiment, the plurality of decode transistors 111 112 113 areconductively connected in parallel with one another.

In an embodiment, the decoder further comprises a third node Node 3, thethird node interconnecting the plurality of decode transistors to aclocking transistor 110 213, 311, the clocking transistor conductivelyconnected to the first power source VSS, the clocking transistor havinga clocking gate configured to receive the evaluation clock signal CLK.

In an embodiment, the clocking transistor FIG. 2 110 213 is the firsttransistor, and the third node Node 3 is conductively connected to thefirst interconnecting node NSHARE.

In an embodiment, the precharge circuits configured to precharge thefirst node Node 1 and the second node Node 2 and first interconnectingnode are delay precharge circuits, each delay precharge circuitconsisting comprising a third transistor 104 105 218, 104 105 or 314serially connected by a respective second connection to a fourthtransistor 211 212 217, 310, the third transistor having a third gateconfigured to receive the evaluation clock signal CLK, the fourthtransistor having a fourth gate configured to receive a delay clocksignal DCLK, the delay clock signal being a delayed version of theevaluation clock signal CLK.

In an embodiment, the one or more precharge circuits comprise a firstprecharge circuit and a second precharge circuit, the first prechargecircuit configured to precharge the first node Node 1 consists of asixth transistor 104 and the second precharge circuit configured toprecharge the second node Node 2 consists of a seventh 105 transistor,the sixth transistor having a sixth gate configured to receive theevaluation clock signal CLK, the seventh transistor having a seventhgate configured to receive the evaluation clock signal CLK.

In an embodiment, the fourth transistor 310 of the dynamic decodecircuit is conductively connected by the second interconnection PSHAREto fourth transistors of a plurality of other dynamic decode circuits,whereby all fourth transistors of all dynamic decode circuits areconductively connected in parallel between the second power source VDDand the second interconnection PSHARE.

In an embodiment the first transistor 213, 312 of the dynamic decodecircuit is conductively connected by the first interconnection NSHARE tofirst transistors of a plurality of other dynamic decode circuits,whereby all first transistors of all dynamic decode circuits areconductively connected in parallel between the first power source andthe first interconnection NSHARE.

In an embodiment, a dynamic decode circuit 250, 350 is providedcomprising: an evaluation clock circuit 201, 301 comprising a pair ofnfet transistors consisting of a first nfet transistor 110, 213, 312serially connected at a first interconnection node NSHARE to a secondnfet transistor 109, 214, 313, the first nfet transistor having a gateconfigured to receive an evaluation clock signal CLK, the second nfettransistor having a gate conductively connected to a first node Node 1,the pair of nfet transistors conductively connected between a firstpower source VSS and a second node Node 2; a decode circuit 200comprising a plurality of third nfet transistors 111 112 113conductively connected in parallel between the first node Node 1 and athird node Node 3, each third nfet transistor having a gate configuredto receive a respective input signal of a plurality of input signals B0B1 B2, the third node conductively connected to the first power sourceVSS through a fourth nfet transistor 211, 312, the fourth nfettransistor having a gate configured to receive the evaluation clocksignal CLK, the third nfet transistors are configured to cause the firstnode to transition to a result value based on state of the plurality ofinput signals B0 B1 B2 and based on the evaluation clock signal CLKbeing high; a precharge circuit consisting of a pair of pfet transistorsconsisting of a fifth pfet transistor 218, 314 serially connected at asecond interconnection node PSHARE to a sixth pfet transistor 217, 310,the fifth pfet transistor having a gate configured to receive a delayedevaluation clock signal DCLK, the sixth pfet transistor having a gateconfigured to receive the evaluation clock signal CLK, the pair of pfettransistors disposed between a second power source VDD and the firstinterconnection node PSHARE, the pair of pfet transistors configured tocause the first interconnection node to be precharged high based on boththe delayed evaluation signal DCLK being low and the evaluation clocksignal CLK being low; and a keeper circuit comprising a seventh pfettransistor 215 conductively connected between the second power sourceVDD and the second node Node 2, the seventh pfet transistor having agate conductively connected to the first node Node 1, the seventh pfettransistor configured to keep the second node high based on the firstnode being low.

In an embodiment, a dynamic decode circuit 250 350 for decoding aplurality of input signals B0 B1 B2, comprises: a decoder 200 comprisinga plurality of decode transistors FIGS. 4, 5, 6, the decode transistorsconfigured to cause a first node Node 1 to be in a first state based onthe input signals B0 B1 B2 being in a first input signal state and anevaluation clock signal CLK being active; the decode transistorsconfigured to cause the first node Node 1 to be in a second state basedon the input signals B0 B1 B2 being in a second input signal state otherthan the first input signal state and the evaluation clock signal CLKbeing active; an evaluate clock circuit 201 301 conductively connectedbetween a first power source VSS and a second node Node 2, the evaluateclock circuit consisting of a first transistor 213 312 and a secondtransistor 214 313, the first transistor 213 312 serially connected tothe second transistor 214 313, the first transistor 213 312 comprising afirst gate configured to receive the evaluation clock signal CLK, thefirst transistor 213 312 configured to conduct based on the evaluationclock signal being active, the second transistor 214 313 comprising asecond gate conductively connected to the first node Node 1, the firsttransistor configured to not conduct based on the evaluation clocksignal being inactive; and one or more delay precharge circuits 104 211,105 212, 104 310, 105 310 conductively connected to a second powersource VDD, the one or more delay precharge circuits configured toprecharge the first node Node 1 and the second node Node 2 based on theevaluation clock signal CLK being inactive, the one or more delayprecharge circuits configured to not conduct based on the evaluationclock signal CLK being active, the delay precharge circuit configured todelay start of precharge by a predetermined delay following theevaluation clock signal CLK becoming inactive FIG. 10.

In an embodiment, the dynamic decode circuit further comprises a delayprecharge clocking circuit FIG. 9 configured to create a clock signalCLK at a clock signal node and a delayed clock signal DCLK at a delayedclock signal node, wherein the delay precharge circuit consists of apair of serially connected delay precharge transistors consisting of afirst precharge transistor 104 105 and a second precharge transistor 211212 310, the first precharge transistor 104 105 having a first prechargegate conductively connected to the clock signal node CLK, the secondprecharge transistor 211 212 310 having a second precharge gateconductively connected to the delayed clock signal node DCLK.

In an embodiment, the delay precharge clocking circuit FIG. 9 comprisesa plurality of inverters 901 902 disposed between the clock signal nodeCLK and the delayed clock signal node DCLK, the plurality of inverters901 902 receiving the clock signal CLK at the clock signal node CLK andoutputing the delay clock signal DCLK at the delayed clock signal nodeDCLK.

In an embodiment, a plurality “n” of dynamic decode circuits Decode 1through Decode n is provided, as shown in FIG. 7, each dynamic decodecircuit comprising a decoder 200 configured to decode a correspondingplurality of input signals B0 x B1 x B2 x, each dynamic decode circuitDecode 1 through Decode n further comprises a conditioning transistor101 102 310 104 105 314 312 311 configured to condition a conditionednode Node 1, Node 2, Node 3, PSHARE or NSHARE of the dynamic decodecircuit, the conditioning transistor having a gate conductivelyconnected to a clock signal CLK or DCLK, the conditioning transistorconductively connected between the conditioned node and a power sourceVSS VDD, each conditioning transistor of each dynamic decode circuitconductively connected in parallel between the power source andinterconnected conditioned nodes NSHARE PSHARE of the plurality ofdynamic decode circuits Decode 1 through Decode n.

Referring to FIG. 3, example conditioning transistor 312 conditions theNSHARE node during the evaluate phase of the clock CLK, conditioningtransistors 310 314 in combination condition the NSHARE node during theprecharge phase of the CLK, and conditioning transistor 310 conditionsthe PSHARE node during the precharge phase of the clock CLK.Furthermore, conditioning transistors 310 104, in combination conditionNode 1 during the precharge phase of the clock CLK, conditioningtransistor 311 conditions Node 3 during the evaluate phase of the clockCLK and conditioning transistors 310 105 in combination condition Node 2during the precharge phase of the clock CLK. Although only PSHARE andNSHARE are shown, any conditioned node may be a candidate for aninterconnected condition node of a plurality of dynamic decode circuitmodules in order to reduce the size of the conditioning transistor(s),as they will share responsibility for providing current to only thesubset (one) of the dynamic decode circuits that can conduct in anysingle clock CLK cycle.

Referring to FIG. 2, example conditioning transistor 213 conditions theNSHARE node during the evaluate phase of the clock CLK, conditioningtransistors 217 218 in combination condition the NSHARE node during theprecharge phase of the CLK, and conditioning transistor 312 conditionsthe PSHARE node during the precharge phase of the clock CLK.Furthermore, conditioning transistors 211 104, in combination conditionNode 1 during the precharge phase of the clock CLK, conditioningtransistors 217 218 in combination condition Node 3 during the evaluatephase of the clock CLK, and conditioning transistors 212 105 incombination condition Node 2 during the precharge phase of the clockCLK.

Precharging conditioning circuits may conduct little or no current whenthe previous evaluate phase did not transition the node from theprecharged state for example. In embodiments, only a maximumpredetermined number of modules can transition the output OUT active(high) in a clock CLK cycle for any combination of inputs as only onethe maximum number (one) of decoders will conduct. In an embodiment, themaximum predetermined number of modules is a single module. Since onlythe maximum predetermined number of modules can transition the outputOUT high, the respective conditioning transistor can be made smallerbecause the current provided by the parallel conditioning transistors ofthe modules is provided by the combined conditioning transistors sharingthe respective conditioned node. For the case where the maximumpredetermined number is x and the number of modules is n, the size ofeach conditioning transistor can be x/n relative to the conditioningtransistor of the prior art, where the conditioning transistor isdesigned to conduct the current of a single, stand-alone module.

In an embodiment, the conditioning transistor comprises a firstprecharge pfet transistor 310 314 configured to precharge theconditioned node PSHARE NSHARE of the dynamic decode circuit 350, theplurality of dynamic decode circuits Decode 1 through Decode n sharingdrains of respective first precharge pfet transistors 310 314.

In an embodiment, the conditioning transistor consists of an nfetevaluate transistor 312 configured to evaluate function of the dynamicdecode circuit 350, the plurality of dynamic decode circuits sharingdrains of respective evaluate transistors 312.

In an embodiment, the conditioning transistor comprises two seriallyconnected transistors 310 314 consisting of the first precharge pfettransistor 314 having a first gate configured to receive an evaluationclock signal CLK and a second precharge pfet transistor 310 having asecond gate configured to receive a delayed evaluation clock signalDCLK.

In an embodiment, the plurality of dynamic decode circuits Decode 1through Decode n are configured, based on the state of the input signalsB0 x B1 x B2 x, to enable a decoder 200 of only a predetermined maximumnumber of dynamic decode circuits x of the plurality n of dynamic decodecircuits to conduct in any clock cycle, wherein size of the conditioningtransistor 310 314 312 is based on a ratio of the predetermined maximumnumber to a total number of dynamic decode circuits.

In an embodiment, the predetermined maximum number is one.

One skilled in the art will appreciate that serially connectedtransistors may be serially connected in any order, for example,evaluation clocking sections 201 clocked transistor 213 could beconnected to Node 2, and transistor 214 could be connected to VSSwithout departing from the teaching. Furthermore, the transistorsreceiving DCLK 211 212 217 could be serially connected to respectivetransistors 104 105 218 such that the transistors receiving CLK areconnected to VDD, and the transistors receiving CLK are connected torespective nodes Node 1 Node 2 NSHARE. Furthermore in embodiments, nodesother than PSHARE and NSHARE may be shared between a plurality ofdynamic decode circuits in order to reduce the size of transistorssharing current. For example, Node 3 could be shared in order to reducethe size of shared evaluation clocking transistor 311.

Although embodiments have been described with reference to a specificembodiment, further modifications and improvements will occur to thoseskilled in the art. For instance, the transistors may be implementedeither as n-channel or p-channel devices as desired. Thesesubstitutions, and the requisite changes caused by them, will be obviousto one skilled in the art. It may be to be understood therefore, thatthe invention encompasses all such modifications that do not depart fromthe spirit and scope of the invention as defined in the appended claims.Also, the designation of portions of the various transistors describedabove as “drain” or “source” may be merely semantic given thebidirectional nature of CMOS circuits and may be arbitrary given theother semiconductor media in which the disclosed invention may bepracticed. Embodiments disclosed use p-channel (pfet) transistors toprecharge nodes as pfet in many technologies may be slower than nfet.Nfet may be shown as evaluate transistors as they may be faster. Giventhe teaching of the present invention, it would be obvious to one ofaverage skill in the art to utilize nfet for precharge and pfet forevaluate functionality, or combinations thereof as desired. The claimstherefore may describe power supplies generically for example as firstpower source and second power source, and the drain, source, and gategenerically for example as a first current electrode, a second currentelectrode and a control electrode, respectively.

What is claimed is:
 1. A plurality of dynamic decode circuits, eachdynamic decode circuit connected between a first power source and asecond power source, each dynamic decode circuit comprising a respectivedecoder, a respective first node, a respective second node and arespective third node, wherein each decoder is configured to decode arespective plurality of input signals, wherein each decoder isconductively connected to a respective first node and to a respectivethird node, wherein each dynamic decode circuit further comprises one ormore respective evaluate transistors, each evaluate transistor connectedto the first power source, each evaluate transistor configured toevaluate respective dynamic logic during an evaluate phase of dynamiclogic, wherein each dynamic decode circuit further comprises one or morerespective precharge circuits, each precharge circuit connected to thesecond power source, each precharge circuit configured to precharge arespective node in a precharge phase of dynamic logic, wherein eachfirst node is connected to a respective precharge circuit, wherein eachthe third node is connected to a respective evaluate transistor, whereineach dynamic decode circuit further comprises a respective conditioningcircuit configured to condition a shared node of the dynamic decodecircuit, the shared node shared by each of the plurality of dynamicdecode circuits, wherein each conditioning circuit is connected inparallel between the shared node and a common power source and whereineach conditioning circuit is any one of a precharge circuit and anevaluate transistor.
 2. A plurality of dynamic decode circuits accordingto claim 1, wherein each dynamic decode circuit further comprises arespective evaluate clock circuit, wherein each evaluate clock circuitis conductively connected between the first power source and therespective second node, wherein each evaluate clock circuit consists ofa first transistor and a second transistor, wherein the first transistoris serially connected by a first interconnecting node to the secondtransistor, the first transistor comprising a first gate configured toreceive an evaluation clock signal, the second transistor comprising asecond gate conductively connected to the first node, the firsttransistor configured to conduct based on the evaluation clock signalbeing active and the first transistor configured to not conduct based onthe evaluation clock signal being inactive, and wherein the conditioningcircuit consists of any one of a precharge circuit and an evaluatetransistor, wherein comprises a first conditioning transistor having afirst conditioning gate configured to receive an evaluation clocksignal, each conditioning circuit of each dynamic decode circuitconductively connected in parallel between a common power source and theshared node.
 3. The plurality of dynamic decode circuits according toclaim 2, wherein each conditioning circuit further comprises a secondconditioning transistor having a second conditioning gate configured toreceive a delayed evaluation clock signal, wherein the firstconditioning transistor is connected in series with the secondconditioning transistor.
 4. The plurality of dynamic decode circuitsaccording to claim 2, wherein each conditioning circuit comprises afirst precharge pfet transistor configured to precharge the shared nodeof the dynamic decode circuit, and the plurality of dynamic decodecircuits sharing drains of respective first precharge pfet transistors.5. The plurality of dynamic decode circuits according to claim 2,wherein each conditioning circuit consists of an nfet evaluatetransistor configured to evaluate function of a respective dynamicdecode circuit, and the plurality of dynamic decode circuits sharingdrains of respective evaluate transistors.
 6. The plurality of dynamicdecode circuits according to claim 4, wherein each conditioning circuitcomprises two serially connected transistors consisting of the firstprecharge pfet transistor having a first gate configured to receive anevaluation clock signal and a second precharge pfet transistor having asecond gate configured to receive a delayed evaluation clock signal. 7.The plurality of dynamic decode circuits according to claim 2, whereinthe plurality of dynamic decode circuits are configured to enabledecoders of only a predetermined maximum number of dynamic decodecircuits of the plurality of dynamic decode circuits to conduct in anyclock cycle, wherein size of the conditioning transistor is determinedby a ratio of the predetermined maximum number to a total number ofdynamic decode circuits.
 8. The plurality of dynamic decode circuitsaccording to claim 7, wherein the plurality of dynamic decode circuitsare configured to enable decoders of only one dynamic decode circuit ofthe plurality of dynamic decode circuits to conduct in any clock cycle9. The plurality of dynamic decode circuits according to claim 2,wherein each decoder comprises a plurality of decode transistors,wherein the decode transistors are configured to cause the first node tobe in a first state based on input signals being in a first input signalstate and an evaluation clock signal being active, wherein the decodetransistors are configured to cause the first node to be in a secondstate based on the input signals being in a second input signal stateother than the first input signal state and the evaluation clock signalbeing active.
 10. The plurality of dynamic decode circuits according toclaim 1, wherein each respective precharge circuit is conductivelyconnected to a second power source, the precharge circuit configured toprecharge a respective node based on the evaluation clock signal beinginactive, and the precharge circuit configured to not conduct based onthe evaluation clock signal being active.
 11. The plurality of dynamicdecode circuits according to claim 10, wherein each respective prechargecircuit consists of a delay precharge transistor, the delay prechargetransistor consisting of a third transistor, the third transistorconfigured to be a conditioning circuit having a third gate configuredto receive a delayed evaluation clock signal, the delayed evaluationclock signal being a delayed version of the evaluation clock signal. 12.The plurality of dynamic decode circuits according to claim 11, whereineach respective precharge circuit consists of a the third transistorserially connected by a second interconnecting node to a fourthtransistor, the fourth transistor having a fourth gate configured to theevaluation clock signal.
 13. The plurality of dynamic decode circuitsaccording to claim 2, wherein each dynamic decode circuit furthercomprises: each decoder comprising a respective plurality of decodetransistors, the decode transistors configured to cause the respectivefirst node to be in a first state based on the input signals being in afirst input signal state and an evaluation clock signal being active,the decode transistors configured to cause the respective first node tobe in a second state based on the input signals being in a second inputsignal state other than the first input signal state and the evaluationclock signal being active; and one or more precharge circuitsconductively connected to a second power source, the one or moreprecharge circuits configured to precharge any one of the respectivefirst node and the respective second node and the respective firstinterconnecting node based on the evaluation clock signal beinginactive, the one or more precharge circuits configured to not conductbased on the evaluation clock signal being active.
 14. The dynamicdecode circuit according to claim 13, wherein at least one of theprecharge circuits of each dynamic decode circuit is a delay prechargecircuit, and the delay precharge circuit configured to delay start ofprecharge by a predetermined delay following the evaluation clockbecoming inactive.
 15. The dynamic decode circuit according to claim 13,wherein each precharge circuit connected to a respective firstinterconnecting node is a delay precharge circuit.